I’m trying to simulate the periodic structure in the simulation file and measuring the reflection from it.
When the periodicity goes beyond a certain amount (340 nm), strange fluctuations and negative transmission appear in the reflection spectrum and simulation does not reach the autoshutoff level.
I decrease the mesh size and increase the simulation time but it sometimes results in diverging and the issue persists. I am interested in measuring the reflection spectrum for periodicity = 350-400 nm.
How can I eliminate this fluctuation? Reflection spectrum (for periodicity = 350, 400 nm) and simulation file are attached in the following.
Thank you in advance,
Al-AlO-Al-Si.fsp (238.6 KB)