I have a 3D carrier concentration distribution in rectilinear (x,y,z) coordinates, obtained from an external program. I would like to import this data as an np Density object in FDTD. I want to use the np information to perturb the index of the base material (silicon, rib waveguide geometry). How do I need to reformat my data so that it can be imported? I know that DEVICE saves np data using a finite-element grid - and this is how it is normally imported to FDTD/MODE. So how is this done for np data that is not on a finite-element grid?
And to calculate the perturbed index in silicon using the Soref method the unperturbed carrier concentrations also need to be known (so that the difference, delta_n and detla_p, can be calculated). How are the unperturbed carrier concentrations included np Density object?
Any help with this issue would be greatly appreciated.