6月29日中文WEBINAR通知

script
fdtd
device
interconnect

#1

关于2016b重大新功能之一API使用介绍.

时间:6月29日周三上午九点(北京时间)
语言:中文
注册链接:https://www.lumerical.com/support/webinar/application_programming_interface.html

The new Lumerical application programming interface (API) allows users to drive other Lumerical applications from the script environment, call Lumerical tools from within MATLAB, or take advantage of the robust optimization routines available from the MATLAB Optimization Toolbox. This gives designers complete freedom to define an arbitrary design process that is both repeatable and highly automated.

We will illustrate this through two examples:

MATLAB optimization of a grating coupler: In this example, we will demonstrate how MATLAB can be used to drive a multi-variable nonlinear optimization of a grating coupler in FDTD Solutions via Lumerical’s Automation API. In addition, we will demonstrate how to setup a MATLAB function based on arbitrary simulation parameters to specify a nonlinear constraint for the optimization.
Traveling wave Mach-Zehnder modulator (TW MZI): In this example, we will demonstrate how to use a single script that performs all of the following analysis functions required to accurate design and characterize a TW MZI:
Optimize the PN junction, making use of the new small-signal AC analysis capability released in DEVICE CT 2016b to efficiently calculate the junction resistance and capacitance;
Calculate the carrier density distribution and use the results in a subsequent eigenmode simulation to determine the optical effective index and group index for each bias point using the FDE solver in MODE Solutions;
Use the same eigenmode analysis tool to retrieve the microwave index and impedance, using the new impedance calculation and Smith chart capabilities that support RF transmission line analysis in MODE Solutions 2016b;
Calculate the phase shift in the MZ arms due to heating using the heat transport solver in DEVICE HT;
Populate the TW MZI compact model in INTERCONNECT with the component-level simulation results and use it to study the effect of index mismatch, impedance mismatch and microwave loss on the circuit level performance of the device.